Method for producing insulated gate thin film semiconductor...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – On insulating substrate or layer

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S164000

Reexamination Certificate

active

06921686

ABSTRACT:
An amorphous semiconductor film is etched so that a width of a narrowest portion thereof is 100 μm or less, thereby forming island semiconductor regions. By irradiating an intense light such as a laser into the island semiconductor regions, photo-annealing is performed to crystallize it. Then, of end portions (peripheral portions) of the island semiconductor regions, at least a portion used to form a channel of a thin film transistor (TFT), or a portion that a gate electrode crosses is etched, so that a region that the distortion is accumulated is removed. By using such semiconductor regions, a TFT is produced.

REFERENCES:
patent: 3848104 (1974-11-01), Locke
patent: 4046618 (1977-09-01), Chaudhari et al.
patent: 4059461 (1977-11-01), Fan et al.
patent: 4083272 (1978-04-01), Miller
patent: 4160263 (1979-07-01), Christy et al.
patent: 4234358 (1980-11-01), Celler et al.
patent: 4249960 (1981-02-01), Schnable et al.
patent: 4309225 (1982-01-01), Fan et al.
patent: 4328553 (1982-05-01), Fredriksen et al.
patent: 4330363 (1982-05-01), Biegesen et al.
patent: 4341569 (1982-07-01), Yaron et al.
patent: 4370175 (1983-01-01), Levatter
patent: 4409724 (1983-10-01), Tasch
patent: 4439245 (1984-03-01), Wu
patent: 4463028 (1984-07-01), Laude
patent: 4468551 (1984-08-01), Neiheisel
patent: 4468853 (1984-09-01), Morita et al.
patent: 4469551 (1984-09-01), Laude
patent: 4498951 (1985-02-01), Tamura et al.
patent: 4545823 (1985-10-01), Drowley
patent: 4599133 (1986-07-01), Miyao et al.
patent: 4734550 (1988-03-01), Imamura et al.
patent: 4764485 (1988-08-01), Loughran et al.
patent: 4803528 (1989-02-01), Pankove
patent: 4835704 (1989-05-01), Eichelberger et al.
patent: 4862227 (1989-08-01), Tsuge et al.
patent: 4937618 (1990-06-01), Ayata et al.
patent: 4956549 (1990-09-01), Henning et al.
patent: 4970366 (1990-11-01), Imatou et al.
patent: 5145808 (1992-09-01), Sameshima
patent: 5217921 (1993-06-01), Kaido et al.
patent: 5219786 (1993-06-01), Noguchi
patent: 5221365 (1993-06-01), Noguchi et al.
patent: 5294811 (1994-03-01), Aoyama et al.
patent: 5313076 (1994-05-01), Yamazaki et al.
patent: 5352291 (1994-10-01), Zhang et al.
patent: 5372836 (1994-12-01), Imahashi et al.
patent: 5409867 (1995-04-01), Asano
patent: 5413958 (1995-05-01), Imahashi et al.
patent: 5424244 (1995-06-01), Zhang et al.
patent: 5448582 (1995-09-01), Lawandy
patent: 5477073 (1995-12-01), Wakai et al.
patent: 5504020 (1996-04-01), Aomori
patent: 5508209 (1996-04-01), Zhang et al.
patent: 5523257 (1996-06-01), Yamazaki et al.
patent: 5529630 (1996-06-01), Imahashi et al.
patent: 5543636 (1996-08-01), Yamazaki
patent: 5561081 (1996-10-01), Takenouchi et al.
patent: 5569610 (1996-10-01), Zhang et al.
patent: 5576556 (1996-11-01), Takemura et al.
patent: 5578520 (1996-11-01), Zhang et al.
patent: 5580801 (1996-12-01), Maegawa
patent: 5589406 (1996-12-01), Kato et al.
patent: 5608232 (1997-03-01), Yamazaki
patent: 5608251 (1997-03-01), Konuma et al.
patent: 5612251 (1997-03-01), Lee
patent: 5622814 (1997-04-01), Miyata et al.
patent: 5623157 (1997-04-01), Miyazaki et al.
patent: 5643801 (1997-07-01), Ishihara et al.
patent: 5648277 (1997-07-01), Zhang et al.
patent: 5681759 (1997-10-01), Zhang
patent: 5696003 (1997-12-01), Makita et al.
patent: 5708252 (1998-01-01), Shinohara et al.
patent: 5712191 (1998-01-01), Nakajima et al.
patent: 5719065 (1998-02-01), Takemura et al.
patent: 5739549 (1998-04-01), Takemura et al.
patent: 5756364 (1998-05-01), Tanaka et al.
patent: 5804878 (1998-09-01), Miyazaki et al.
patent: 5821138 (1998-10-01), Yamazaki et al.
patent: 5891764 (1999-04-01), Ishihara et al.
patent: 5891766 (1999-04-01), Yamazaki et al.
patent: 5939731 (1999-08-01), Yamazaki et al.
patent: 5943354 (1999-08-01), Lawandy
patent: 5945711 (1999-08-01), Takemura et al.
patent: 5953597 (1999-09-01), Kusumoto et al.
patent: 5956105 (1999-09-01), Yamazaki et al.
patent: 5962869 (1999-10-01), Yamazaki et al.
patent: 5962872 (1999-10-01), Zhang et al.
patent: 5962897 (1999-10-01), Takemura et al.
patent: RE36371 (1999-11-01), Imahashi et al.
patent: 6204099 (2001-03-01), Kusumoto et al.
patent: 6413805 (2002-07-01), Zhang et al.
patent: 6458200 (2002-10-01), Zhang
patent: 6602765 (2003-08-01), Jiroku et al.
patent: 0598394 (1993-11-01), None
patent: 55-067132 (1980-05-01), None
patent: 57-072319 (1982-05-01), None
patent: 57-94482 (1982-06-01), None
patent: 57-109322 (1982-07-01), None
patent: 57-193291 (1982-11-01), None
patent: 58-192381 (1983-11-01), None
patent: 60-202931 (1985-10-01), None
patent: 60-245172 (1985-12-01), None
patent: 60-245173 (1985-12-01), None
patent: 60-245174 (1985-12-01), None
patent: 61-116873 (1986-06-01), None
patent: 61-145819 (1986-07-01), None
patent: 62-104117 (1987-05-01), None
patent: 62-250629 (1987-10-01), None
patent: 63-314862 (1988-12-01), None
patent: 3-201538 (1991-09-01), None
patent: 03-267374 (1991-11-01), None
patent: 04-037144 (1992-02-01), None
patent: 4282869 (1992-10-01), None
patent: 04-286318 (1992-10-01), None
patent: 5-152333 (1993-06-01), None
patent: 05-267771 (1993-10-01), None
patent: 5275336 (1993-10-01), None
patent: 5-299339 (1993-11-01), None
patent: 06-045272 (1994-05-01), None
patent: 06-267989 (1994-09-01), None
patent: 06-295859 (1994-10-01), None
patent: 06-318701 (1994-11-01), None
patent: 06-330322 (1994-11-01), None
patent: 8-228006 (1996-09-01), None
Foti, et al., “Laser Annealing of Semiconductors”, J.M. Poate (ed.) Epitaxy by Pulsed Annealing of Ion-Implanted Silicon, 1982, Academic Press, pp. 203-245.
Young, et al., “Effect of Pulse Duration on the Annealing of Ion Implanted Silicon With a XeCl Excimer Laser and Solar Cells”, in Laser-Solid Interactions and Transient Thermal Processing of Materials, 1983, pp. 401-406.
Biegelsen, et al., “Laser-Inducted Crystallization of Silicon on Bulk Amorphous Substrates: An Overview” in Laser-Solid Interactions and Transient Thermal Processing of Materials, 1983, pp. 537-548.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method for producing insulated gate thin film semiconductor... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for producing insulated gate thin film semiconductor..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for producing insulated gate thin film semiconductor... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3427183

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.