Method for producing a torsion spring

Etching a substrate: processes – Etching of semiconductor material to produce an article...

Reexamination Certificate

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Reexamination Certificate

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06863832

ABSTRACT:
A method for producing a silicon torsion spring capable, for example, of reading the rotation rate in a microstructured torsion spring/mass system. The system that is produced achieves a low torsional stiffness compared to a relatively high transverse stiffness in the lateral and vertical directions. The method proceeds from a wafer or wafer composite and, upon suitable mask coverage, a spring with a V-shaped cross section is formed by anisotropic wet-chemical etching which preferably extends over the entire wafer thickness and is laterally delimited only by [111] planes. Two of the wafers or wafer composites prepared in this way are rotated through 180° and joined to one another oriented mirrorsymmetrically with respect to one another, so that overall the desired X-shaped cross section is formed.

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C. Kaufman et al., “Characterization of Material and Structure Defects on Micromechanical Scanners by Means of Frequency Analysis,”Proceedings of Micro Materials(1995) p. 443 ff.
P. Enoksson et al., “A Silicon Resonant Sensor Structure for Coriolis Mass-Flow Measurements,”Journal of Micromechanical Systems, vol. 6, No. 2, (Jun. 1997), pp. 119 through 125.
J. Choi et al., “Silicon Anagular Rate Sensor by Deep Reactive Ion Etching,”Proceedings of the Interantional Symposium on Microsystems, Intelligent Materials and Robots(Sendai, Japan, 1995), pp. 29 through 32.

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