Semiconductor device manufacturing: process – Radiation or energy treatment modifying properties of...
Reexamination Certificate
2006-02-17
2009-06-30
Everhart, Caridad M (Department: 2895)
Semiconductor device manufacturing: process
Radiation or energy treatment modifying properties of...
C438S487000, C257S075000, C257SE21471, C257SE21475, C257SE21328
Reexamination Certificate
active
07553778
ABSTRACT:
A method for producing a semiconductor device includes irradiating an amorphous semiconductor film on an insulating material with a pulsed laser beam having a rectangular irradiation area, while scanning in a direction intersecting a longitudinal direction of the irradiation area, thereby forming a first polycrystalline semiconductor film, and irradiating a part of the amorphous semiconductor film with the laser beam, while scanning in a longitudinal direction intersecting the irradiation area, the part superposing the first polycrystalline semiconductor film and being adjacent to the first polycrystalline semiconductor film, thereby forming a second polycrystalline semiconductor film. The laser beam has a wavelength in a range from 390 nm to 640 nm, and the amorphous semiconductor film has a thickness in a range from 60 nm to 100 nm.
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Nakagawa Naoki
Sono Atsuhiro
Sugahara Kazuyuki
Yamayoshi Kazushi
Yura Shinsuke
Everhart Caridad M
Leydig , Voit & Mayer, Ltd.
Mitsubishi Denki & Kabushiki Kaisha
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