Method for producing a micromechanical component having a...

Semiconductor device manufacturing: process – Making device or circuit responsive to nonelectrical signal – Physical stress responsive

Reexamination Certificate

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Details

C438S694000, C438S706000, C438S735000, C257SE21222

Reexamination Certificate

active

07851248

ABSTRACT:
A capping technology is provided in which, despite the fact that structures which are surrounded by a silicon-germanium filling layer are exposed using ClF3etching through micropores in the silicon cap, an etching attack on the silicon cap is prevented, namely, either by particularly selective (approximately 10,000:1 or higher) adjustment of the etching process itself, or by using the finding that the oxide of a germanium-rich layer, in contrast to oxidized porous silicon, is not stable but instead may be easily dissolved, to protect the silicon cap.

REFERENCES:
patent: 6936902 (2005-08-01), Reichenbach et al.
patent: 2003/0141561 (2003-07-01), Fischer et al.
patent: 2004/0245586 (2004-12-01), Partridge et al.
patent: 2004/0248344 (2004-12-01), Partridge et al.
patent: 2005/0204821 (2005-09-01), Fischer et al.
patent: 2005/0255710 (2005-11-01), You et al.
patent: 2008/0311751 (2008-12-01), Laermer et al.
patent: 2009/0026561 (2009-01-01), Reichenbach et al.
patent: 19961578 (2001-06-01), None
patent: 10006035 (2001-08-01), None
patent: 102004036803 (2006-03-01), None
patent: WO 2006/081636 (2006-08-01), None
International Search Report, PCT International Application No. PCT/EP2007/058684, dated Dec. 3, 2007.

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