Method for preventing circuit failures due to gate oxide...

Details Method for preventing circuit failures due to gate oxide... Method for preventing circuit failures due to gate oxide...

2006-10-24

2006-10-24

Dinh, Paul (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Nanotechnology related integrated circuit design

Reexamination Certificate

active

07127689

ABSTRACT:
A method is disclosed for preventing circuit failures due to gate oxide leakage, and is used to efficiently check many nets of a circuit on a chip or within a macro to find logical fails due to gate oxide leakage using DC calculations, wherein the gate leakage is treated as a noise source for a static noise analysis of the circuit.

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R, Rodriquez-Montanes, J.A. Segura, V.H. Champac, J. Figueras and J.A. Rubio, Current vs. logic testing of gate oxide short floating gate bridging failures in CMOS, Proc. Int. Test Conf., pp. 510-519, Oct. 1991.

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