Method for preparation of transmission electron microscope sampl

Radiant energy – Inspection of solids or liquids by charged particles – Methods

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

250311, 25049221, 20419234, 20429836, H01J 3726

Patent

active

054401232

ABSTRACT:
A method for processing sample material for use with transmission electron microscopes utilizes a sheet mesh for supporting the sample material during irradiation processing. The sheet mesh is formed of a metallic sheet material having a single opening provided in a central portion thereof, a circumferential edge portion of the opening is tapered from one side of the sheet mesh through to the other and the ankle of the taper corresponds to the ankle of irradiation. Position determining portions are provided on the sheet mesh to assure reliable positioning of the sample material. Also, the method provides a for preparation of the sample material including a protective layer formed over a membrane layer for allowing adhesion of membrane layers made of materials which would otherwise degrade the adhesion layer during processing.

REFERENCES:
patent: 4128765 (1978-12-01), Franks
patent: 4618767 (1986-10-01), Smith et al.
patent: 4860224 (1989-08-01), Cashell
patent: 5009738 (1991-04-01), Gruenwald
patent: 5009743 (1991-04-01), Swann
patent: 5150391 (1992-09-01), Ebinuma et al.
patent: 5289005 (1994-02-01), Narose et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method for preparation of transmission electron microscope sampl does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for preparation of transmission electron microscope sampl, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for preparation of transmission electron microscope sampl will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-972961

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.