Method for predicting whether a failure of an electrical...

Details Method for predicting whether a failure of an electrical... Method for predicting whether a failure of an electrical...

2005-12-06

2005-12-06

Hoff, Marc S. (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C702S057000, C702S059000, C702S190000

Reexamination Certificate

active

06973391

ABSTRACT:
A method of predicting whether a failure of an electrical device may occur if a receiver within the electrical device is subjected to an electrical noise pulse. The method may include locating an integrated circuit that drives the receiver and locating an integrated circuit that is driven by the receiver, the integrated circuit that is driven by the receiver having a circuit type and a capacitance. The method may also include selecting a plurality of noise-tolerance curves and then selecting one of the plurality of noise-tolerance curves. The method may also include selecting a set of noise-propagation constants and then selecting a noise-propagation constant from the set of noise-propagation constants. The method may further include generating an offset noise-tolerance curve by offsetting the selected one of the plurality of noise-tolerance curves by the noise-propagation constant, determining a noise-tolerance for the receiver; and then comparing the noise-tolerance to the amplitude of the noise pulse.

REFERENCES:
patent: 5535133 (1996-07-01), Petschauer et al.
patent: 6026286 (2000-02-01), Long
patent: 6278951 (2001-08-01), Sato
patent: 6388487 (2002-05-01), Hirose
patent: 6820234 (2004-11-01), Deas et al.
patent: 6897683 (2005-05-01), Kernahan et al.

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