4. Data processing: measuring, calibrating, or testing
  5. Measurement system in a specific environment
  6. Electrical signal parameter measurement system

Omar G. Dahroug

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Method and apparatus for generating circuit model for static...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Method for predicting whether a failure of an electrical...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2889184

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