Method for predicting performance of integrated circuit and...

Details Method for predicting performance of integrated circuit and... Method for predicting performance of integrated circuit and...

2006-04-04

2006-04-04

Do, Thuan (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Nanotechnology related integrated circuit design

C716S030000, C716S030000, C716S030000

Reexamination Certificate

active

07024645

ABSTRACT:
From a trend for performance correlation coefficients (M1, M2) between circuits of the same type and of different process generations, a performance correlation coefficient M between a current generation circuit and a next generation circuit is predicted, and from a trend for performance correlation coefficients (R1, R2, R3) between circuits of the same process generation and of different types, a performance correlation coefficient R between different types of circuits in accordance with a next generation process is predicted. Thus, based on known performance of a circuit A, performances of a next generation circuits AA and BB are predicted using the predicted performance correlation coefficients M and R.

REFERENCES:
patent: 2002/0133772 (2002-09-01), Voorakaranam et al.
patent: 10-284606 (1998-10-01), None

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