Coating processes – Measuring – testing – or indicating
Reexamination Certificate
2005-04-14
2009-02-03
Fletcher, III, William Phillip (Department: 1792)
Coating processes
Measuring, testing, or indicating
C427S407100, C427S409000
Reexamination Certificate
active
07485336
ABSTRACT:
Disclosed is a method for evaluating chip performance of a cured coating system. In one embodiment, the method includes providing a coated substrate comprising a substrate and a cured film of a first coating composition thereon, measuring elastic work energy (We/Wtot) of the cured film, and calculating a % C.P. of the cured film via the formula: % C.P.=7.61636−0.225473 (We/Wtot) wherein a % C.P. of equal to or less than about 3.5% correlates to a total paint loss of equal to or less than 5% of a coating system comprising the first coating composition. The disclosed method predicts the gravelometer chip performance of a cured multilayer coating system comprising a first coating composition and a topcoat by measuring the measuring elastic work energy (We/Wtot) of the cured first coating system alone. In one embodiment, chip performance can be predicted without topcoat application and independent of topcoat composition.
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December Timothy S.
Fenwick Marc Bennett
Kobayashi-San Yoshiko
Kubish Scott
Lanza JoAnn
BASF Corporation
Fletcher, III William Phillip
Toyota Motor Engineering & Manufacturing North America, Inc
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