Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2008-07-29
2008-07-29
Whitmore, Stacy A (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
Reexamination Certificate
active
07406671
ABSTRACT:
The present invention provides a method for performing design rule check (DRC) of an integrated circuit. A design layout of the integrated circuit is provided. The integrated circuit includes a complex circuit. A DRC tool is used to compare a portion of the design layout with a reference layout containing an accurate implementation of the complex circuit. The portion of the design layout corresponds to the complex circuit.
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Corbeil, Jr. John D.
Saunders Michael J.
LSI Corporation
Suiter Swantz pc llo
Whitmore Stacy A
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