Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Making electrical device
Reexamination Certificate
2005-02-15
2005-02-15
Huff, Mark F. (Department: 1756)
Radiation imagery chemistry: process, composition, or product th
Imaging affecting physical property of radiation sensitive...
Making electrical device
C430S311000, C430S318000, C430S322000, C430S325000, C430S945000
Reexamination Certificate
active
06855483
ABSTRACT:
A negative pattern is formed to be transparent in the far ultraviolet region including the wavelength 193 nm of an ArF excimer laser and, despite its chemical structure having high dry etching, does not swell and has excellent resolution. An acid-catalyzed reaction is utilized wherein a γ-hydroxy or δ-hydroxy carboxylic acid structure is partially or entirely converted to a γ-lactone or δ-lactone structure. The negative pattern is developed with an aqueous alkali solution without swelling.
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Hattori Takashi
Shiraishi Hiroshi
Tsuchiya Yuko
Barreca Nicole
Hitachi , Ltd.
Huff Mark F.
Mattingly Stanger & Malur, P.C.
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