Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Junction field effect transistor
Reexamination Certificate
2007-05-08
2010-02-23
Dang, Phuc T (Department: 2892)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Junction field effect transistor
C257S288000, C257S289000
Reexamination Certificate
active
07667247
ABSTRACT:
The present disclosure provides a method of fabricating a semiconductor device. The method includes providing a semiconductor substrate, forming a dielectric layer over the semiconductor substrate, treating the dielectric layer with a carbon containing group, forming a conductive layer over the treated dielectric layer, and patterning and etching the dielectric layer and conductive layer to form a gate structure. The carbon containing group includes an OCH3or CN species.
REFERENCES:
patent: 5814149 (1998-09-01), Shintani et al.
patent: 6984565 (2006-01-01), Kawahara
patent: 7242055 (2007-07-01), Bojarczuk et al.
patent: 7271103 (2007-09-01), Huang et al.
patent: 7387973 (2008-06-01), Wang et al.
patent: 2004/0129200 (2004-07-01), Kouvetakis et al.
patent: 2004/0261689 (2004-12-01), Tsong et al.
patent: 2005/0236679 (2005-10-01), Hori et al.
patent: 2006/0160372 (2006-07-01), Dorfman
patent: 2006/0172474 (2006-08-01), Wajda et al.
patent: 2008/0096394 (2008-04-01), Chen et al.
Lee Wen-Chin
Tang Denny
Wang Ching-Ya
Dang Phuc T
Haynes and Boone LLP
Taiwan Semiconductor Manufacturing Company , Ltd.
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