Method for parametrizing an integrated circuit and an...

Details Method for parametrizing an integrated circuit and an... Method for parametrizing an integrated circuit and an...

2005-11-22

2005-11-22

Lamarre, Guy J. (Department: 2133)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

C365S005000, C327S143000

Reexamination Certificate

active

06968484

ABSTRACT:
A method is described for parametrizing an integrated circuit by applying a digital start command signal followed by a parametrization data signal to the supply voltage terminal and/or the output terminal of the integrated circuit. During the parametrization process, the voltage level applied to the supply voltage terminal and/or the output terminal is kept above the normal operating voltage level and detected by a detector device provided in integrated circuit. The integrated circuit includes the supply voltage terminal, a reference potential terminal, and the output terminal, as well as an internal memory which is preferably non-volatile. The adjustment specification for parametrizing the integrated circuit is stored in the memory and activated by the parametrization data signal.

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Doso, B., 09017957A, Patent Abstracts of Japan, Jan. 17, 1997.

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