Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2007-07-24
2007-07-24
Chiang, Jack (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C716S030000, C361S600000, C257S678000
Reexamination Certificate
active
10383139
ABSTRACT:
A method for enhancing the high frequency signal integrity performance of a printed circuit board (PCB) or backplane is provided. According to one embodiment of the present invention, the method involves the use of S-parameters as the primary cost factors associated with an iterative process to optimize the physical dimensions and shape of a single or a collection of vias within the PCB or backplane. In certain embodiments, the process involves the representation of the via components as equivalent lumped series admittances and impedances, as well as, RLGC sub-circuits upon which basic circuit analysis is performed to optimize secondary characteristics, for example, the maximization of the sub-circuit's resistance and/or the minimization of the sub-circuit's capacitance. The iterative process involves the alteration of physical dimensions and the shape of the via components such that the secondary characteristics are optimized.
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Gisin Franz
Khandokar Mahamud
Panos William
Chiang Jack
Perkins Coie LLP
Rossoshek Helen
Sanmina-SCI Corporation
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