Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2007-05-15
2007-05-15
Mehta, Bhavesh M (Department: 2624)
Image analysis
Applications
Manufacturing or product inspection
C382S141000, C382S145000, C382S147000, C382S232000, C382S249000, C700S110000, C702S035000
Reexamination Certificate
active
10166296
ABSTRACT:
A method for identification of anomalous structures, such as defects, includes the steps of providing a digital image and applying fractal encoding to identify a location of at least one anomalous portion of the image. The method does not require a reference image to identify the location of the anomalous portion. The method can further include the step of initializing an active contour based on the location information obtained from the fractal encoding step and deforming an active contour to enhance the boundary delineation of the anomalous portion.
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Gleason Shaun S.
Sari-Sarraf Hamed
Akerman & Senterfitt
Jetter Neil R.
Mehta Bhavesh M
Strege John
Ut-Battelle LLC
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