4. Image analysis
  5. Applications
  6. Manufacturing or product inspection

Hamed Sari-Sarraf

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Automated defect spatial signature analysis for semiconductor ma

Image analysis – Applications – Manufacturing or product inspection
Patent

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Context-based automated defect classification system using...

Data processing: generic control systems or specific application – Specific application – apparatus or process – Product assembly or manufacturing
Reexamination Certificate

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Fabric wrinkle evaluation

Radiant energy – Photocells; circuits and apparatus – With circuit for evaluating a web – strand – strip – or sheet
Reexamination Certificate

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Four-dimensional characterization of a sheet-forming web

Image analysis – Applications – Document or print quality inspection
Reexamination Certificate

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Method for identification of cotton contaminants with x-ray...

X-ray or gamma ray systems or devices – Specific application – Absorption
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1483414

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