Method for non-contact testing of marginal integrated...

Details Method for non-contact testing of marginal integrated... Method for non-contact testing of marginal integrated...

2007-11-13

2007-11-13

Nguyen, Vinh (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S538000

Reexamination Certificate

active

11484952

ABSTRACT:
Non-contact connectivity testing of joints connecting circuit junctions are improved through knowledge of characteristics of semiconductor junctions connected to component nodes of components of a device under test (DUT) to allow detection of high-impedance joints.

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