Method for modeling inductive effects on circuit performance

Details Method for modeling inductive effects on circuit performance Method for modeling inductive effects on circuit performance

2006-09-19

2006-09-19

Karlsen, Ernest (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S763010

Reexamination Certificate

active

07109738

ABSTRACT:
A method for testing a partially fabricated wafer is provided that comprises the following steps: providing a device under test (DUT) and three reference oscillators overlying a substrate of the wafer; measuring the frequencies of the reference oscillators as influenced by transistor characteristics, intra structure parasitics, resistive, capacitive and inductive parasitics; and isolating the inductive parasitics by the appropriate comparisons between the reference oscillators.

REFERENCES:
patent: 5504434 (1996-04-01), Schepis et al.
patent: 6166607 (2000-12-01), Schoellkopf
patent: 6731129 (2004-05-01), Belluomini et al.
patent: 6925404 (2005-08-01), Corr
patent: 2005/0166100 (2005-07-01), Heaton et al.

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