Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent
1996-02-08
1998-09-01
Hantis, K.
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
G01J 328
Patent
active
058018298
ABSTRACT:
A method of measuring and compensating the effects of stray light in a spectrometer and use of the method to improve linearity and accuracy in the spectrometer. Light from a broadband light source (100) is blocked in a particular band of wavelengths by an optical filter (104) and light outside the particular band of wavelengths is transmitted by the filter. A spectral measurement within the particular band measures aggregate offset, including the effects of stray light, dark current and electronic offset. In absorption spectrometry, a first spectral measurement within the particular band is measured with a chemical sample not present and a second measurement is made with a chemical sample present. The first spectral measurement is used for compensation of a reference spectrum and the second spectral measurement is used for compensation of a sample spectrum, each within the particular band. Further compensation is made for insertion loss of a filter and stray light having wavelengths within the band of wavelengths of the particular band.
REFERENCES:
patent: 4526470 (1985-07-01), Kaye
patent: 4798464 (1989-01-01), Boostrom
Patent Abstracts of Japan, vol. 009, No. 221, p. 386, 7 Sep. 1985 & JP-A-60 079248 (Hitachi Seisakusho KK) 7 May 1985 *abstract* only.
Martin Roland
Mueller Beno
Hantis K.
Hewlett--Packard Company
Winfield Augustus W.
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