Method for measuring diffraction patterns from a...

Details Method for measuring diffraction patterns from a... Method for measuring diffraction patterns from a...

2003-09-02

2009-10-13

Wells, Nikita (Department: 2881)

Radiant energy

Inspection of solids or liquids by charged particles

Electron microscope type

C250S310000

Reexamination Certificate

active

07601956

ABSTRACT:
A device and method which enable a transmission electron microscope to measure electron diffraction patterns of a sample very precisely are disclosed. The patterns are suitable for structure determination. The electron beam is precessed by means of deflector coils (6) in the transmission electron microscope before the sample (4), in combination with a similar precession of the electron diffraction pattern by means of deflector coils (9) situated after the sample. The electron diffraction pattern is scanned by means of deflector coils (9) situated after the sample.

REFERENCES:
patent: 3849647 (1974-11-01), Koike et al.
patent: 4697080 (1987-09-01), King
patent: 6420701 (2002-07-01), Hashimoto
patent: 6548811 (2003-04-01), Nakamura et al.
patent: 6750451 (2004-06-01), Koguchi et al.
patent: 7022988 (2006-04-01), Taniguchi et al.
patent: 2004/0000641 (2004-01-01), Taniguchi et al.
Avalov, et al. “Scanning System for High-Energy Electron Diffractometry,”Journal of Applied Crystallography, vol. 32, pp. 1033-1038, 1999.
Vincent, et al. “Double Conical Beam-Rocking System for Measurement of Integrated Electron Diffraction Intensities,”Ultramicroscopy, vol. 53, pp. 271-282, 1994.
International Search Report dated May 13, 2004.

Affiliated with

Also associated with

Rating

Method for measuring diffraction patterns from a... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for measuring diffraction patterns from a..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for measuring diffraction patterns from a... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4081296