Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1986-05-20
1989-07-11
Rosenberger, Richard A.
Optics: measuring and testing
By polarized light examination
With light attenuation
356 1, G01B 902
Patent
active
048465763
ABSTRACT:
A method for measuring a three-dimensional position of an object with a single camera and a multislit light, i.e., a source of multiplanar light beams. A surface of the object is irradiated with multislit lights, i.e., multiplanar light beams, having a plurality of slit light faces and also irradiated with a single standard slit light having a slit light face identical to one of the plurality of slit light faces of the multislit lights. A plurality of slit light photo images corresponding to a plurality of slit light projected images and a standard slit light photo image corresponding to a slit light projected image formed on the object are obtained. One of the slit light photo images which corresponds to the standard slit light photo image is specified and made to correspond, to compute a three-dimensional position of the object in a predetermined coordinate.
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Hanahara Keishi
Kanda Shinji
Maruyama Tsugito
Fujitsu Limited
Rosenberger Richard A.
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