4. Image analysis
  5. Pattern recognition
  6. Feature extraction

Shinji Kanda

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Area detection apparatus

Image analysis – Image transformation or preprocessing – Measuring image properties
Patent

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Blasting method and apparatus

Abrading – Abrading process – Utilizing fluent abradant
Patent

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Data storage device

Electrical computers and digital data processing systems: input/ – Input/output data processing – Peripheral configuration
Reexamination Certificate

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Method for determining orientation of contour line segment in lo

Image analysis – Pattern recognition – Feature extraction
Patent

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Method for determining orientation of contour line segment in lo

Image analysis – Pattern recognition – Feature extraction
Patent

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Profile ID: LFUS-PAI-P-403672

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