Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Gettering of semiconductor substrate
Reexamination Certificate
2010-04-07
2011-12-20
Ghyka, Alexander (Department: 2812)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Gettering of semiconductor substrate
C438S158000, C257SE21318, C257SE21414
Reexamination Certificate
active
08080449
ABSTRACT:
Gate electrodes are formed on a substrate. A gate insulation film is formed so as to cover the gate electrodes. A semiconductor layer is formed in regions on the gate insulation film in a region which overlap with at least the gate electrodes. Plasma treatment is applied to the semiconductor layer using a gas which contains a dopant thus increasing impurity concentration of a surface layer of the semiconductor layer. A conductive film is formed on the surface layer of the semiconductor layer to which the plasma treatment is applied. A source electrode and a drain electrode are formed by etching the conductive film.
REFERENCES:
patent: 5627089 (1997-05-01), Kim et al.
patent: 2002/0009836 (2002-01-01), Takechi
patent: 2003/0207503 (2003-11-01), Yamazaki et al.
patent: 2009/0152635 (2009-06-01), Jeong et al.
patent: 11-87721 (1999-03-01), None
Kaitoh Takuo
Miyake Hidekazu
Nitta Hidekazu
Sonoda Daisuke
Antonelli, Terry Stout & Kraus, LLP.
Ghyka Alexander
Hitachi Displays Ltd.
Isaac Stanetta
Panasonic Liquid Crystal Display Co., Ltd.
LandOfFree
Method for manufacturing thin-film transistors does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method for manufacturing thin-film transistors, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for manufacturing thin-film transistors will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4313718