Semiconductor device manufacturing: process – Formation of semiconductive active region on any substrate
Reexamination Certificate
2004-12-30
2008-08-12
Mulpuri, Savitri (Department: 2812)
Semiconductor device manufacturing: process
Formation of semiconductive active region on any substrate
C257SE21090
Reexamination Certificate
active
07410888
ABSTRACT:
In accordance with a particular embodiment of the present invention, a method for manufacturing strained silicon is provided. In one embodiment, the method for manufacturing strained silicon includes inducing a curvature in a silicon wafer, depositing an epitaxial layer of silicon upon an upper surface of the silicon water while the silicon wafer is under the induced curvature, and releasing the silicon wafer from the induced curvature, after depositing the epitaxial layer, such that a strain is induced in the epitaxial layer.
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Endsley Grady L.
Knipe Richard L.
Brady, III. Wade James
Mulpuri Savitri
Telecky , Jr. Frederick J.
Texas Instruments Incorporated
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