Method for manufacturing semiconductor devices having dual damas

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

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438623, 438725, H01L 214763

Patent

active

061658995

ABSTRACT:
A first insulating film is formed on a semiconductor substrate. On the first insulating film, a first photoresist is then formed. A pattern for contact hole is formed in the first photoresist. Thereafter, the first insulating film is etched by using the first photoresist as a mask, and thereby a contact hole is formed. The first photoresist is then removed, and an organic insulating film is formed on a whole surface. In addition, a second insulating film is formed on the organic insulating film. Subsequently, a second photoresist is formed on the second insulating film. A pattern for wiring trench is formed in the second photoresist. Thereafter, the second insulating film is etched by using the second photoresist as a mask. Subsequently, the organic insulating film is etched by using the second insulating film as a mask, and thereby a wiring trench is formed.

REFERENCES:
patent: 4789648 (1988-12-01), Chow et al.
patent: 4944836 (1990-07-01), Beyer et al.
patent: 5559055 (1996-09-01), Chang et al.
patent: 5677243 (1997-10-01), Ohsaki
patent: 5705430 (1998-01-01), Avanzino et al.
patent: 5920790 (1999-07-01), Wetzel et al.

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