Semiconductor device manufacturing: process – Gettering of substrate
Reexamination Certificate
2008-04-29
2008-04-29
Lebentritt, Michael (Department: 2812)
Semiconductor device manufacturing: process
Gettering of substrate
C438S758000, C438S928000, C257SE21318
Reexamination Certificate
active
07364987
ABSTRACT:
In a method of forming a semiconductor device, a copper diffusion-prevention layer is formed underneath a substrate. Impurity regions are formed on the surface of the substrate. A copper wiring is electrically connected to the impurity regions. The copper diffusion-prevention layer is formed before forming the lightly doped source/drain regions to prevent copper atoms from diffusing into the substrate.
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Ahn Jong-hyon
Kang Hee-Sung
Kang Tae-Woong
Youn Ki-Seog
Isaac Stanetta
Lebentritt Michael
Samsung Electronics Co,. Ltd.
Volentine & Whitt P.L.L.C.
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