Semiconductor device manufacturing: process – Introduction of conductivity modifying dopant into...
Reexamination Certificate
2011-03-15
2011-03-15
Menz, Laura M (Department: 2813)
Semiconductor device manufacturing: process
Introduction of conductivity modifying dopant into...
C438S288000, C438S285000
Reexamination Certificate
active
07906416
ABSTRACT:
A method for manufacturing a semiconductor device from a semiconductor wafer having a first major surface, a recess provided inside a periphery on opposite side of the first major surface and surrounded by the periphery, and a second major surface provided at bottom of the recess is provided. The method comprises: fitting into the recess a doping mask having selectively formed openings to selectively cover the second major surface with the doping mask; and selectively introducing dopant into the second major surface.
REFERENCES:
patent: 6037632 (2000-03-01), Omura et al.
patent: 6710418 (2004-03-01), Sapp
patent: 7038272 (2006-05-01), Weber et al.
patent: 7161208 (2007-01-01), Spring et al.
patent: 7224008 (2007-05-01), Rahimo et al.
patent: 7268079 (2007-09-01), Falck et al.
patent: 7576388 (2009-08-01), Wilson et al.
patent: 7675111 (2010-03-01), Arai
patent: 7745289 (2010-06-01), Bencuya et al.
patent: 2004/0065909 (2004-04-01), Weber et al.
patent: 2006/0022261 (2006-02-01), Rahimo et al.
patent: 2006/0051923 (2006-03-01), Falck et al.
patent: 2007/0020887 (2007-01-01), Sekiya
patent: 2008/0090391 (2008-04-01), Tsuchitani et al.
patent: 2006-59876 (2006-03-01), None
patent: 2007-35756 (2007-02-01), None
Kobayashi Motoshige
Nozaki Hideki
Tsuchitani Masanobu
Kabushiki Kaisha Toshiba
Menz Laura M
Oblon, Spivak McClelland, Maier & Neustadt, L.L.P.
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