Semiconductor device manufacturing: process – Chemical etching – Combined with coating step
Reexamination Certificate
2011-03-15
2011-03-15
Norton, Nadine G (Department: 1713)
Semiconductor device manufacturing: process
Chemical etching
Combined with coating step
C438S700000, C438S706000, C438S711000, C438S719000, C257S620000, C257S758000, C257S760000, C257S774000, C257S797000
Reexamination Certificate
active
07906432
ABSTRACT:
A method of manufacturing a semiconductor device in which a source contact plug and a drain contact plug are formed. The method includes the steps of etching part of the semiconductor substrate to form a step, thus forming an overlay vernier, and forming a hard mask on the step so that the step is maintained.
REFERENCES:
patent: 6952886 (2005-10-01), Kim
patent: 2001/0029079 (2001-10-01), Yokoyama
patent: 2006/0211216 (2006-09-01), Sandhu et al.
patent: 1020000004414 (2000-01-01), None
Angadi Maki A
Hynix / Semiconductor Inc.
Kilpatrick Townsend & Stockton LLP
Norton Nadine G
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