Method for manufacturing semiconductor device

Adhesive bonding and miscellaneous chemical manufacture – Delaminating processes adapted for specified product – Delaminating in preparation for post processing recycling step

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156646, 156653, 156657, 1566591, 156662, 357 41, 357 67, 357 71, 437 41, 437 58, 437192, 437197, 437228, 437238, 437241, H01L 2100, H01L 21306, B44C 122, C03C 1500

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047847182

ABSTRACT:
Disclosed is a semiconductor device with its gate electrode and source/drain extraction electrodes being made of the same material on a GaAs substrate, and with its source/drain heavily doped regions, which are formed by doping Se in a lightly doped semiconductor layer on the GaAs substrate, self-aligned with both gate electrode and source/drain extraction electrodes.

REFERENCES:
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patent: 4532004 (1985-07-01), Akiyama et al.
patent: 4546540 (1985-10-01), Ueyanagi et al.
patent: 4561169 (1985-12-01), Miyazaki et al.
patent: 4572765 (1986-02-01), Berry
patent: 4700455 (1987-10-01), Shimada et al.
Patent Abstracts of Japan, vol. 9, No. 178 (E-330) (1901), Jul. 23, 1985, Japanese Patent Application 60-50965 (Toshiba K.K.), Mar. 23, 1985.
Applied Physics Letter, vol. 40, No. 9, May 1, 1982, pp. 805-807, American Institute of Physica, New York, R. L. Chapman et al., "Transient Annealing of Selenium-Implanted Gallium Arsenide Using a Graphite Strip Heater".
IBM Technical Disclosure Bulletin, vol. 24, No. 7A, Dec. 1981, pp. 3432-3433, Armonk, N.Y., H. S. Bhatia et al., "High Performance Mesfet Structure".

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