Semiconductor device manufacturing: process – Chemical etching – Combined with coating step
Reexamination Certificate
2006-09-12
2006-09-12
Smith, Zandra V. (Department: 2822)
Semiconductor device manufacturing: process
Chemical etching
Combined with coating step
C438S666000, C438S618000, C438S928000, C438S937000
Reexamination Certificate
active
07105451
ABSTRACT:
A resist pattern formed so as to expose a wafer edge region is used to expose an edge surface region of an Si support substrate by dry etching. Next, a conductive layer constituted as wirings by subsequent patterning is formed by sputtering.
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Novacek Christy
Oki Electric Industry Co. Ltd.
Smith Zandra V.
VolentineFrancos&Whitt,PLLC
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