Etching a substrate: processes – Etching to produce porous or perforated article
Reexamination Certificate
2008-07-08
2008-07-08
Culbert, Roberts (Department: 1792)
Etching a substrate: processes
Etching to produce porous or perforated article
C438S458000
Reexamination Certificate
active
07396479
ABSTRACT:
A method for preparing porous silicon in which an oxidized single crystal silicon wafer is first bonded to a polycrystalline wafer. The oxidized high quality wafer is then thinned to the desired thickness by grinding and polishing. An oxide may then be deposited on the wafer and patterned to expose regions were the porous silicon will be formed. The single crystal silicon wafer may then etched in the unmasked areas of the pattern to thin the single crystal silicon wafer to the desired thickness in the range of 0.1 microns to 1.0 microns. Next, the porous silicon may be formed using standard techniques. Once the porous silicon is formed the polycrystalline silicon wafer may be ground away and the oxide layer may be undercut to expose the porous silicon. Finally, an appropriate liner material may be applied to the porous silicon.
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USPTO Office Action, dated Feb. 25, 2008, for U.S. Appl. No. 10/883,469.
Myers Alan M.
Ravi Kramadhati
Culbert Roberts
Intel Corporation
Troutman Sanders LLP
Yancey, Jr. James Hunt
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