Semiconductor device manufacturing: process – Chemical etching – Combined with coating step
Reexamination Certificate
2005-07-05
2005-07-05
Goudreau, George A. (Department: 1763)
Semiconductor device manufacturing: process
Chemical etching
Combined with coating step
Reexamination Certificate
active
06914003
ABSTRACT:
A method for manufacturing a magnetic random access memory is disclosed. An interlayer insulating film is formed on a lower read layer, a cell region of the interlayer insulating film is etched according to a photo etching process using a cell mask, and a MTJ layer is formed on the lower read layer of the cell region and the interlayer insulating film of a peripheral circuit region. The sidewall of the interlayer insulating film is exposed, the MTJ layer is left merely in the cell region by lifting off the interlayer insulating film, and a bit line which is an upper read layer connected to the MTJ layer is formed in a succeeding process. Accordingly, an effective area of an MTJ cell is obtained and the properties and reliability of the MRAM are improved.
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Search Report from German Patent and Trademark Office dated Dec. 2, 2003 (3 pages).
Jang In Woo
Kim Chang Shuk
Kyung Hee
Lee Kye Nam
Park Young Jin
Goudreau George A.
Hynix / Semiconductor Inc.
Marshall & Gerstein & Borun LLP
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