Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – On insulating substrate or layer
Reexamination Certificate
2006-09-26
2009-11-10
Mulpuri, Savitri (Department: 2812)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
On insulating substrate or layer
C438S551000, C438S552000, C438S553000, C438S555000, C438S671000, C257SE21121, C257SE21125, C257SE21127, C257SE21131
Reexamination Certificate
active
07615420
ABSTRACT:
The method for manufacturing the indium gallium aluminium nitride (InGaAlN) thin film on silicon substrate, which comprises the following steps: introducing magnesium metal for processing online region mask film, that is, or forming one magnesium mask film layer or metal transition layer; then forming one metal transition layer or magnesium mask layer, finally forming one layer of indium gallium aluminium nitride semiconductor layer; or firstly forming one layer of metal transition layer on silicon substrate and then forming the first indium gallium aluminium nitride semiconductor layer, magnesium mask layer and second indium gallium aluminium nitride semiconductor layer in this order. This invention can reduce the dislocation density of indium gallium aluminium nitride materials and improve crystal quality.
REFERENCES:
patent: 5152805 (1992-10-01), Geddes et al.
patent: 6955932 (2005-10-01), Hovel et al.
Fang Wenqing
Jiang Fengyi
Wang Li
Ahmadi Mohsen
Lattice Power (Jiangxi) Corporation
Mulpuri Savitri
Park Vaughan & Fleming LLP
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