Semiconductor device manufacturing: process – Formation of semiconductive active region on any substrate – Fluid growth from gaseous state combined with preceding...
Patent
1998-06-23
2000-08-29
Bowers, Charles
Semiconductor device manufacturing: process
Formation of semiconductive active region on any substrate
Fluid growth from gaseous state combined with preceding...
438478, 117952, H01L 2120
Patent
active
06110809&
ABSTRACT:
A new method for manufacturing a Group III metal nitride epitaxial wafer comprises providing a first nitrogen-contained gas source, providing a second Group III metal trichloride--containing gas source, and causing said first gas to react with second gas in a heating region, thereby forming a Group III metal nitride epitaxial layer on a substrate. The formed epitaxial wafer can serve as a substrate of a laser diode.
REFERENCES:
patent: 4144116 (1979-03-01), Jacob et al.
Lee et al., "Vapor phase epitaxy of GaN using GaC13/N2", Journal of Crystal Growth, vol. 169, pp. 689-696, Dec. 1996.
Topf et al., "Low-pressure chemical vapor deposition of GaN epitaxial films", Journal of Crystal Growth, vol. 189-190, pp. 330-334, Jun. 1998.
Chan Shih-Hsiung
Guo Jan-Dar
Lai Wei-Chi
Sze Simon M.
Tsang Jian-Shihn
Bowers Charles
Christianson Keith
LandOfFree
Method for manufacturing an epitaxial wafer with a group III met does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method for manufacturing an epitaxial wafer with a group III met, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for manufacturing an epitaxial wafer with a group III met will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1249308