Semiconductor device manufacturing: process – Chemical etching – Combined with coating step
Reexamination Certificate
2007-07-24
2007-07-24
Smtih, Matthew (Department: 2823)
Semiconductor device manufacturing: process
Chemical etching
Combined with coating step
C438S508000, C438S508000, C257SE31126, C257SE33064, C379S093190, C977S811000
Reexamination Certificate
active
10998897
ABSTRACT:
A conductive pattern, made of a transparent conductive oxide, such as ITO including electrodes (2) and conductive paths (4) is formed on one face of a transparent substrate (3) made of sapphire or toughened glass, then coated with a first layer (5) of a transparent dielectric with a low refractive index, such as MgF2or LiF2, and then a second layer (7) of another transparent dielectric having a higher refractive index than the first, such as Al2O3, Ta2O5or DLC.
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Patent Abstracts of Japan, vol. 0102, No. 12, (P-480) Jul. 24, 1986, & JP 61 051101 (Toray Ind. Inc.) Mar. 13, 1986.
Grupp Joachim
Poli Gian-Carlo
Asulab S.A.
Pham Thanh V.
Smtih Matthew
Sughrue & Mion, PLLC
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