Method for manufacturing a transistor having a low leakage curre

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – On insulating substrate or layer

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438155, 438166, 438 30, 438163, 438158, 438149, 257192, 257 66, 257350, H01L 310328

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active

060806079

ABSTRACT:
The invention provides a method for manufacturing a transistor having a low leakage current. In general, spacers must be formed to isolate a gate from a subsequently-formed drain, thereby reducing a leakage current. In the invention, the spacers are formed on the vertical sides of the gate by using a selective deposition process. Therefore, the method for manufacturing a transistor having a low leakage current according to the invention not only constitutes a simplified process, but also controls the widths of the spacers precisely, so that the leakage current of the transistor can be greatly decreased.

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