Method for manufacturing a semiconductor device using the...

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

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C257SE21476

Reexamination Certificate

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07741219

ABSTRACT:
In one embodiment, a method, comprises forming a diffusion layer on a semiconductor substrate, forming a selectively deposited metal or metal alloy on an aluminum gate structure by removing an aluminum oxide layer from the aluminum gate structure and depositing a zinc layer on the aluminum gate structure by a zincating process, and selectively depositing a sacrificial metal or metal alloy cap on the aluminum gate layer by displacing the zinc layer. This embodiment enables the SAC process flow on devices with Aluminum gates.

REFERENCES:
patent: 6083828 (2000-07-01), Lin et al.
patent: 7091610 (2006-08-01), Bohr
patent: 2006/0032757 (2006-02-01), Brevnov et al.
patent: 2006/0223302 (2006-10-01), Chang et al.
Saito et al., “Electrochemical analysis of zincate treatments for Al and Al alloy films”, Electrochimica Acta, 51 (2005) pp. 1017-1020.
Delaunois, F et al., “Heat Treatment for Electroless Nickel-Boron Plating on Aluminum Alloys”,Surface and Coatings Technology160, (Mar. 4, 2002), pp. 239-248.

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