Method for manufacturing a semiconductor device having contact p

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

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Details

438647, 438657, 438659, 438660, 438674, 438763, 438796, 257742, 257743, 257748, H01L 214763, H01L 2144, H01L 2131

Patent

active

06030894&

ABSTRACT:
On a main surface of a silicon substrate of one conductivity type, a diffusion layer of the opposite conductivity type is formed, and the main surface of the silicon substrate is covered by an insulator film. The insulator film is formed with a contact hole which extends to reach the diffusion layer of the opposite conductivity type. A contact plug is provided in the contact hole. The contact plug fills the contact hole and comprises a first silicon layer of the opposite conductivity type directly connected to the diffusion layer of the opposite conductivity type, a silicon-germanium alloy layer of the opposite conductivity type directly contact to the first silicon layer, and a second silicon layer of the opposite conductivity type directly contact to the silicon-germanium alloy layer. Wiring is provided on the surface of the insulator film in direct contact to the contact plug. As a result, increase in leakage at the junction of the diffusion layer is prevented by the low-resistance contact plug including the silicon-germanium alloy.

REFERENCES:
patent: 5399511 (1995-03-01), Taka et al.
patent: 5461250 (1995-10-01), Burghartz et al.
patent: 5561326 (1996-10-01), Ito et al.
patent: 5633179 (1997-05-01), Kamins et al.
patent: 5895948 (1999-04-01), Mori et al.

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