Method for manufacturing a semiconductor device having a limited

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having schottky gate

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438229, 257365, H01L 2128, H01L 2146

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active

059239697

ABSTRACT:
In order to reduce the thickness of an impurity diffusion region of a first conductivity type formed near the surface of a semiconductor substrate, a pocket region is formed under the impurity diffusion region. If the pocket region is large, a junction capacitance between the impurity diffusion region and the pocket region cannot be neglected. In order to reduce the size of the pocket region to the minimum permissible size, gates and dummy gates which are temporarily formed to suppress the non-uniformity of the gate dimensions by uniformly giving an influence of the optical proximity effect to a plurality of gates are used as a mask used for implanting an impurity into the surface portion of the semiconductor substrate to form the pocket regions. Thus, the pocket region can be formed in a limited area between the gate and the dummy gate.

REFERENCES:
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patent: 4963501 (1990-10-01), Ryan et al.
patent: 4975382 (1990-12-01), Takasugi
patent: 5336624 (1994-08-01), Walden
patent: 5410161 (1995-04-01), Narita
patent: 5426326 (1995-06-01), Ohyu et al.
patent: 5449937 (1995-09-01), Arimura et al.

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