Method for manufacturing a semiconductor device

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437235, 437942, 437943, 427582X, 427583, 427584, 148DIG3, 148DIG4, 148DIG90, 148DIG93, H01L 21306

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053875460

ABSTRACT:
The present invention relates to a method for manufacturing a semiconductor device including a method for reforming an insulating film formed by a low temperature CVD method. It is an object of the present Invention to provide a method for manufacturing a semiconductor device capable of improving a film quality of an insulating film formed by a CVD method which is able to form a film at a low temperature and also capable of maintaining mass productivity, in which processing by irradiation with ultraviolet rays of the insulating film while heating the film after forming an insulating film (4) on a body to be formed by a chemical vapor deposition method is included.

REFERENCES:
patent: 4588610 (1986-05-01), Yamazaki
patent: 4595601 (1986-06-01), Horioka et al.
patent: 4702936 (1987-10-01), Maeda et al.
patent: 4842891 (1989-06-01), Miyazaki et al.
patent: 5171710 (1992-12-01), Yamazaki et al.
Patent Abstracts of Japan, vol. 015, No. 054 (E-1031) Feb. 8, 1991 & JP-A-22 83 022 (Hitachi Ltd.) Nov. 20, 1990.
Journal of the Electrochemical Society, vol. 138, No. 12, Dec. 1991, Manchester, New Hampshire US, pp. 3727-3732, K. Fujino et al. "Low Temperature and Atmospheric Pressure CVD Using Polysiloxane, OMCTS, and Ozone", p. 3727, Col. 1, para. 2.
Patent Abstracts of Japan, vol. 014, No. 362 (E-960) Aug. 6, 1990, & JP-A-21 28 460 (NEC Corp.) May 16, 1990.
Patent Abstracts of Japan, vol. 7, No. 200 (E-196) (1345) Sep. 3, 1983 & JP-A-58 98 933 (Suwa Seikosha K.K.) Jun. 13, 1983.

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