Method for manufacturing a microstructure, exposure device,...

Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Making electrical device

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C430S022000

Reexamination Certificate

active

07867692

ABSTRACT:
Aspects of the invention can provide a method for manufacturing a microstructure, including forming a photosensitive film above a work piece, exposing the photosensitive film, as a first exposure, by irradiating interference light generated by intersecting two laser beams having a wavelength shorter than a wavelength of visible light, developing the exposed photosensitive film so as to develop a shape corresponding to a pattern of the interference light to the photosensitive film, and etching the work piece using the developed photosensitive film as an etching mask.

REFERENCES:
patent: 4996120 (1991-02-01), Smothers et al.
patent: 5415835 (1995-05-01), Brueck et al.
patent: 5759744 (1998-06-01), Brueck et al.
patent: 5885753 (1999-03-01), Crooks et al.
patent: 6074800 (2000-06-01), Breyta et al.
patent: 6122103 (2000-09-01), Perkins et al.
patent: 6218292 (2001-04-01), Foote
patent: 6243199 (2001-06-01), Hansen et al.
patent: 6243348 (2001-06-01), Goodberlet
patent: 6548820 (2003-04-01), Mermelstein
patent: 6882477 (2005-04-01), Schattenburg et al.
patent: 2002/0105628 (2002-08-01), Saito et al.
patent: 2006/0109532 (2006-05-01), Savas et al.
patent: 0 939 343 (1999-09-01), None
patent: A 58-154285 (1983-09-01), None
patent: A-06-053122 (1994-02-01), None
patent: A-06-300909 (1994-10-01), None
patent: A-07-159609 (1995-06-01), None
patent: A-07-263321 (1995-10-01), None
patent: A 11-26344 (1999-01-01), None
patent: A-11-345758 (1999-12-01), None
patent: 2001-033982 (2001-09-01), None
patent: B1-10-0400893 (1995-12-01), None
patent: 445512 (2001-07-01), None
patent: WO 01/35168 (2001-05-01), None
Deguchi et al., “Nanofabrication Techniques Using X-Rays,” Japan Society of Applied Physics, vol. 73, No. 4, pp. 455-461, 2004 with partial translation.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method for manufacturing a microstructure, exposure device,... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for manufacturing a microstructure, exposure device,..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for manufacturing a microstructure, exposure device,... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2707811

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.