Method for manufacturing a GaN based optical device

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S603000, C438S604000, C438S048000, C438S508000

Reexamination Certificate

active

07863178

ABSTRACT:
The present invention relates to an AlGaInN based optical device fabricated by a new p-type AlGaInN:Mg growth method and method for manufacturing the same, including a p-type nitride semiconductor layer that is grown using both NH3and a hydrazine based source as a nitrogen precursor, thereby an additional subsequent annealing process for extracting hydrogen is not necessary and thus the process is simple and an active layer can be prevented from being thermally damaged by subsequent annealing.

REFERENCES:
patent: 5247533 (1993-09-01), Okazaki et al.
patent: 5306662 (1994-04-01), Nakamura et al.
patent: 6043140 (2000-03-01), Kawai et al.
patent: 6413312 (2002-07-01), Kawai et al.
patent: 6508879 (2003-01-01), Hashimoto
patent: 2006/0157714 (2006-07-01), Yoo et al.
patent: 08056015 (1994-12-01), None
patent: 8-255930 (1996-10-01), None
patent: 8-316151 (1996-11-01), None
patent: 9-251957 (1997-09-01), None
patent: 2003-178987 (2003-06-01), None
patent: 10-2001-0046264 (2001-06-01), None
English abstract and machine translation of JP 08-056015.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method for manufacturing a GaN based optical device does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for manufacturing a GaN based optical device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for manufacturing a GaN based optical device will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2696091

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.