Method for making thin film transistor

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – On insulating substrate or layer

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438159, 438486, 438487, H01L 2100, H01L 2120

Patent

active

060202246

ABSTRACT:
In production of a thin film transistor, a gate electrode is formed on an insulating substrate. A gate nitride film and a gate oxide film are formed on the gate electrode. A semiconductor thin film is formed on the gate oxide film. The semiconductor thin film is irradiated with laser light for crystallization. The growth of the crystal grains in a first section of the semiconductor thin film lying just above the gate electrode is more significant than that of the crystal grains in a second section of the semiconductor thin film lying in a position other than just above the gate electrode. An impurity is selectively doped into the second section of the semiconductor thin film to form a source region and a drain region, while the first section of the semiconductor thin film is left without modification as a channel-forming region.

REFERENCES:
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patent: 5366926 (1994-11-01), Mei et al.
patent: 5478766 (1995-12-01), Park et al.
patent: 5529951 (1996-06-01), Noguchi et al.
patent: 5834071 (1998-11-01), Lin
patent: 5920772 (1999-07-01), Lin
patent: 5943593 (1999-08-01), Noguchi et al.
patent: 5946562 (1999-08-01), Kuo

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