Active solid-state devices (e.g. – transistors – solid-state diode – Integrated circuit structure with electrically isolated... – Passive components in ics
Reexamination Certificate
2006-03-07
2006-03-07
Le, Dung A. (Department: 2818)
Active solid-state devices (e.g., transistors, solid-state diode
Integrated circuit structure with electrically isolated...
Passive components in ics
C257S529000, C257S313000, C257S315000, C438S257000, C438S593000, C365S065000, C365S117000
Reexamination Certificate
active
07009275
ABSTRACT:
An improved method for fabricating a three dimensional monolithic memory with increased density. The method includes forming conductors preferably comprising tungsten, then filling and planarizing; above the conductors forming semiconductor elements preferably comprising two diode portions and an antifuse, then filling and planarizing; and continuing to form conductors and semiconductor elements in multiple stories of memories. The arrangement of processing steps and the choice of materials decreases aspect ratio of each memory cell, improving the reliability of gap fill and preventing etch undercut.
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Herner S. Brad
Mahajani Maitreyee
Le Dung A.
Matrix Semiconductor Inc.
Matrix Semiconductor, Inc
Squyres Pamela J.
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