Method for making heterojunction bipolar transistor with self-al

Semiconductor device manufacturing: process – Forming bipolar transistor by formation or alteration of... – Having heterojunction

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

257198, 257197, 438317, 438936, H01L 21265

Patent

active

056565143

ABSTRACT:
A high gain, high frequency transistor is formed having a combination of a moderately doped retrograde emitter and a collector which is formed by self-aligned implantation through an emitter opening window. This combination allows continued base width scaling and ensures high current capability yet limits the electric field at the emitter-base junction, particularly near the base contacts, in order to reduce leakage and capacitance and to enhance breakdown voltage. Cut-off frequencies on the order of 100 GHz can thus be obtained in the performance of a transistor with a 30 nm base width in a SiGe device.

REFERENCES:
patent: 4319932 (1982-03-01), Jambotkar
patent: 4967254 (1990-10-01), Shimura
patent: 5006912 (1991-04-01), Smith et al.
patent: 5063427 (1991-11-01), Tully et al.
patent: 5106767 (1992-04-01), Comfort et al.
patent: 5323032 (1994-06-01), Sato et al.
patent: 5346840 (1994-09-01), Fujioka
patent: 5389803 (1995-02-01), Mohammad
Theodore Kamins et al, "Small-Geometry . . . Bipolar Transistors", IEEE Electron Device Letters, vol. 10, No. 11, Nov. 1989.
IEDM-89, Dec. 1989, IEDM Tech. Dig., p. 890, "A 45 GHz strained-layer SiGe Heterojunction Bipolar Transistor Fabricated With Low Temperature EPI" by Fischer et al.
"Thermodynamic Analysis of SlxGel-x"; S. Change et al.; Department of Chemical Engineering; University of Florida; Proceedings of the Tenth International Conference on Chemical Vapor Deposition; 1987; pp. 122-131.
"Cooperative growth phenomena in silicon/germanium low-temperature epitaxy"; Bernard S. Meyerson et al.; IBM Research Division; T.J. Watson Rsearch Center; Appl. Phys. Lett. 53 (25); Dec. 19, 1988; pp. 2555-2557.
"75-GHz fr SiGe-Base Heterojunction Bipolar Transistors"; Gary L. Patton et al. 1990 IEEE; pp. 171-173.
"Submicrometer Si and Si-Ge Epitaxial-Base Double-Poly Self-Aligned Bipolar Transistors"; T.C. Chen et al.; IEEE Transactions on Electron Devices; vol. 38, No. 4, Apr. 1991; pp. 941-943.
"High Frequency Si/Sil-x Gex Heterojunction Bipolar Transistors"; T.I. Kamins et al.; 1989 IEEE; IEDM 89; pp. 647-649.
"Heterostructure Bipolar Transistors and Integrated Circuits"; Herbert Kroemer; 1982 IEEE; pp. 13-25.
"Graded-SiGe-Base, Poly-emitter Heterojunction Bipolar Transistors"; Gary L. Patton; 1989 IEEE; vol. 10, No. 113, Dec. 1989; pp. 534-536.
"Small-Geometry, High-Performance, Si-Si1-xGex Heterojunction Bipolar Transistors"; Theodore I. Kamins et al.; 1989 IEEE; pp. 503-505.
"Self-Aligned SiGe-Base Heterojunction Bipolar Transistor by Selective Epitaxy Emitter Window (SEEW) Technology"; Joachim N. Burghartz et al.; 1990 IEEE; pp. 287-290.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method for making heterojunction bipolar transistor with self-al does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for making heterojunction bipolar transistor with self-al, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for making heterojunction bipolar transistor with self-al will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-159856

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.