Method for making a semiconductor device

Adhesive bonding and miscellaneous chemical manufacture – Delaminating processes adapted for specified product – Delaminating in preparation for post processing recycling step

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29571, 148187, 156657, 1566591, 156662, 156904, 357 23, 357 41, 357 59, 427 86, 427 93, H01L 21306

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active

042193796

ABSTRACT:
A method for making a semiconductor device is described in which polycrystalline silicon is vacuum deposited and then converted to silicon dioxide thereby providing a number of advantages over direct deposition of silicon dioxide. The method has particular applicability to isoplanar MOSFET integrated circuit manufacturing.

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IBM Technical Disclosure Bulletin, vol. 15, No. 6, Nov. 1972, Fabricating Submicrometer Silicon Devices, by E. Bassous, pp. 1823-1825.
IBM Technical Disclosure Bulletin, vol. 15, No. 10, Mar. 1973, FET Integrated Circuit Having Two Polysilicon Layers, by S. A. Abbas, pp. 3022-3023.
IBM Technical Disclosure Bulletin, vol. 14, No. 4, Sep. 1971, Surface Protected Etching Technique for Silicon Gate FETs, by Jones et al., pp. 1052-1053.

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