Method for investigating surfaces at nanometer and picosecond re

Details Method for investigating surfaces at nanometer and picosecond re Method for investigating surfaces at nanometer and picosecond re

1988-06-20

1990-04-17

Anderson, Bruce C.

Radiant energy

Inspection of solids or liquids by charged particles

250307, H01J 3700

Patent

active

049183095

ABSTRACT:
For observing material structures and/or dynamic processes at surfaces, the known scanning tunneling microscope (STM) is combined with a photoexcitation process leading to photon-assisted tunneling. Thereby, the very fine spatial resolution of the STM is combined with the picosecond or even femtosecond time resolution of laser pulses. The tunnel tip of a scanning tunneling microscope is positioned at tunnel distance with respect to the surface of the sample to be investigated, with an appropriate potential applied across the gap between the tunnel tip and the sample. The tunneling current is gated by means of at least one pulsed laser beam directed at the tuneling region and/or at the tunnel tip.

REFERENCES:
patent: 4747698 (1988-05-01), Wickramasinghe et al.
patent: 4750822 (1988-06-01), Rosencwaig et al.

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