Method for integrating silicon-on-nothing devices with...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – On insulating substrate or layer

Reexamination Certificate

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C257S350000, C257SE21415, C257SE29295

Reexamination Certificate

active

07906381

ABSTRACT:
A method is provided for fabricating transistors of first and second types in a single substrate. First and second active zones of the substrate are delimited by lateral isolation trench regions, and a portion of the second active zone is removed so that the second active zone is below the first active zone. First and second layers of semiconductor material are formed on the second active zone, so that the second layer is substantially in the same plane as the first active zone. Insulated gates are produced on the first active zone and the second layer. At least one isolation trench region is selectively removed, and the first layer is selectively removed so as to form a tunnel under the second layer. The tunnel is filled with a dielectric material to insulate the second layer from the second active zone of the substrate. Also provided is such an integrated circuit.

REFERENCES:
patent: 5894152 (1999-04-01), Jaso et al.
patent: 6333532 (2001-12-01), Davari et al.
patent: 2003/0151112 (2003-08-01), Yamada et al.
patent: 2005/0170604 (2005-08-01), Orlowski et al.
patent: 2007/0138536 (2007-06-01), Arai et al.
patent: 2 812 764 (2002-02-01), None
patent: WO 2007/014294 (2007-02-01), None
Yamada et al., “An Embedded DRAM Tehnology on SOI/Bulk Hybrid Substrate Formed with SEG Process for High-End SOC Application,” 2002 Symposium on VLSI Technology Digest of Technical Papers, Honolulu, Jun. 11-13, 2002, Symposium on VLSI Technology, New York NY, IEEE, US, Jun. 11, 2002, pp. 112-113, XP001109841, ISBN: 0-7803-7312-X.
Skotnicki et al., “SON (Silicon On Nothing) Platform for ULSI Era: Technology & Devices,” International Journal of High Speed Electronics and Systems, Mar. 2006, vol. 16 No. 1, pp. 137-146, XP009093131, © World Scientific Publishing Company.
International Preliminary Search Report dated Dec. 5, 2007 for FR 0704870.

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