Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2005-05-17
2005-05-17
Ahmed, Samir (Department: 2623)
Image analysis
Applications
Manufacturing or product inspection
C348S129000, C356S394000, C250S559390
Reexamination Certificate
active
06895108
ABSTRACT:
A method of inspecting for defects in the shape of an object, using an inspected image obtained from an object to be inspected, comprising the steps of: setting a reference image of a reference model for determining the defect in shape of the object to be inspected; obtaining the imaged image from the object to be inspected; comparing the corresponding whole or local area of the reference image with the inspected image in terms of brightness; and determining as to whether or not the object is defective in shape. According to the present invention, the shape defect inspection does not rely upon the skilled person's experience, can reduce time required for inspection, and can be made for the whole area of the inspection area.
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Canadian Office Actionof the Canadian Patent Application No. 2,317,803 (dated Jan. 9, 2004).
Ahmed Samir
Bushnell , Esq. Robert E.
Samsung Electronics Co,. Ltd.
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